Skip to main content
Advanced Search
Search Terms
Content Type

Exact Matches
Tag Searches
Date Options
Updated after
Updated before
Created after
Created before

Search Results

13 total results found

Overview

I03 – Macromolecular Crystallography

I03 is a highly automated beamline for macromolecular crystallography, supporting rapid data collection from protein crystals at cryogenic temperatures. It is optimised for high-throughput screening and for challenging targets such as membrane proteins. The I0...

Content type
Beamline documentation
Science Group
Macromolecular Crystallography
Technique
Macromolecular crystallography
Technique
X-ray diffraction
Instrument
I03
Content owner
Dr Alex Morgan
Review date
2025-03-01
Migrated from
/Instruments/Mx/I03.html

Data collection

I03 – Macromolecular Crystallography

Diffraction from a crystal lattice obeys Bragg's law \(n\lambda = 2d\sin\theta\), where \(d\) is the lattice spacing. The accessible resolution depends on the X-ray wavelength and detector distance. Parameter Value (demo) Energy range 5–25 keV Beam size Variab...

Content type
Beamline documentation
Science Group
Macromolecular Crystallography
Technique
Macromolecular crystallography
Technique
X-ray diffraction
Instrument
I03
Content owner
Dr Alex Morgan
Review date
2025-03-01
Migrated from
/Instruments/Mx/I03.html

Before your visit

I03 – Macromolecular Crystallography

Safety induction for visiting users Accessing your data after your visit

Content type
Beamline documentation
Science Group
Macromolecular Crystallography
Technique
Macromolecular crystallography
Technique
X-ray diffraction
Instrument
I03
Content owner
Dr Alex Morgan
Review date
2025-03-01
Migrated from
/Instruments/Mx/I03.html

Overview

I11 – High Resolution Powder Diffraction

I11 provides high-resolution and time-resolved powder diffraction for materials science, chemistry and pharmaceutical research. Long-duration experiments can run on the dedicated LDE facility. I11 diffractometer (demo image) Documents 📄 I11 Beamline User Guide...

Content type
Beamline documentation
Science Group
Crystallography
Technique
Powder diffraction
Technique
X-ray diffraction
Instrument
I11
Content owner
Dr Priya Shah
Review date
2025-01-15
Migrated from
/Instruments/Crystallography/I11.html

Measuring d-spacings

I11 – High Resolution Powder Diffraction

Peak positions are converted to d-spacings using \(d = \frac{\lambda}{2\sin\theta}\). Multi-analyser crystal detectors give the very high angular resolution needed to separate overlapping peaks.

Content type
Beamline documentation
Science Group
Crystallography
Technique
Powder diffraction
Technique
X-ray diffraction
Instrument
I11
Content owner
Dr Priya Shah
Review date
2025-01-15
Migrated from
/Instruments/Crystallography/I11.html

Before your visit

I11 – High Resolution Powder Diffraction

Safety induction for visiting users

Content type
Beamline documentation
Science Group
Crystallography
Technique
Powder diffraction
Technique
X-ray diffraction
Instrument
I11
Content owner
Dr Priya Shah
Review date
2025-01-15
Migrated from
/Instruments/Crystallography/I11.html

Overview

I22 – Small Angle Scattering & Diffraction

I22 combines small-angle (SAXS) and wide-angle (WAXS) X-ray scattering to study structure across length scales from nanometres to hundreds of nanometres, including polymers, colloids and biological tissue. I22 small-angle scattering camera (demo image)

Content type
Beamline documentation
Science Group
Soft Condensed Matter
Technique
SAXS
Technique
WAXS
Instrument
I22
Content owner
Dr Tom Okafor
Review date
2024-11-30
Migrated from
/Instruments/Soft-Condensed-Matter/I22.html
Migration status
Needs update

The scattering vector

I22 – Small Angle Scattering & Diffraction

Scattering data are reported as a function of \(q = \frac{4\pi\sin\theta}{\lambda}\), which relates directly to real-space length scales via \(d = 2\pi / q\).

Content type
Beamline documentation
Science Group
Soft Condensed Matter
Technique
SAXS
Technique
WAXS
Instrument
I22
Content owner
Dr Tom Okafor
Review date
2024-11-30
Migrated from
/Instruments/Soft-Condensed-Matter/I22.html
Migration status
Needs update

Before your visit

I22 – Small Angle Scattering & Diffraction

Safety induction for visiting users Accessing your data after your visit

Content type
Beamline documentation
Science Group
Soft Condensed Matter
Technique
SAXS
Technique
WAXS
Instrument
I22
Content owner
Dr Tom Okafor
Review date
2024-11-30
Migrated from
/Instruments/Soft-Condensed-Matter/I22.html
Migration status
Needs update

Overview

I08 – Scanning X-ray Microscopy

I08 delivers soft X-ray scanning transmission microscopy (STXM) and ptychography for chemical imaging at the nanoscale, used in environmental, biological and materials science. I08 scanning X-ray microscope (demo image)

Content type
Beamline documentation
Science Group
Imaging and Microscopy
Technique
Scanning transmission X-ray microscopy
Technique
Ptychography
Instrument
I08
Content owner
Dr Lena Fischer
Review date
2025-02-10
Migrated from
/Instruments/Imaging-and-Microscopy/I08.html

Before your visit

I08 – Scanning X-ray Microscopy

Safety induction for visiting users

Content type
Beamline documentation
Science Group
Imaging and Microscopy
Technique
Scanning transmission X-ray microscopy
Technique
Ptychography
Instrument
I08
Content owner
Dr Lena Fischer
Review date
2025-02-10
Migrated from
/Instruments/Imaging-and-Microscopy/I08.html

Overview

B16 – Test Beamline

B16 is a flexible test beamline for developing and characterising X-ray optics, detectors and new experimental techniques before they are deployed on user beamlines. B16 test beamline optics bench (demo image)

Content type
Beamline documentation
Science Group
Optics and Metrology
Technique
X-ray optics testing
Technique
Detector development
Instrument
B16
Content owner
Dr Sam Patel
Review date
2024-09-01
Migrated from
/Instruments/Optics-and-Metrology/B16.html

Before your visit

B16 – Test Beamline

Safety induction for visiting users

Content type
Beamline documentation
Science Group
Optics and Metrology
Technique
X-ray optics testing
Technique
Detector development
Instrument
B16
Content owner
Dr Sam Patel
Review date
2024-09-01
Migrated from
/Instruments/Optics-and-Metrology/B16.html